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Photoreflectance characterization of an InP/InGaAs heterojunction bipolar transistor structure
Yan, D., Pollak, Fred H., Boccio, V. T., Lin, C. L., Kirchner, P. D., Woodall, J. M., Gee, Russell C., Asbeck, Peter M.Volume:
61
Year:
1992
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.108308
File:
PDF, 570 KB
english, 1992