Recent advances in the assessment of GaAs substrate quality...

Materials Science and Engineering: B 1993 Vol. 20; Iss. 1-2

Recent advances in the assessment of GaAs substrate quality by scanning photoluminescence

K. Schohe, F. Krafft, C. Klingelhöfer, M. Garrigues, S.K. Krawczyk, J. Weyher
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Volume:
20
Year:
1993
Language:
english
Pages:
7
DOI:
10.1016/0921-5107(93)90411-f
File:
PDF, 3.10 MB
english, 1993
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