Study of the leakage current suppression for...

Microelectronics Reliability 2015 / 02 Vol. 55; Iss. 2

Study of the leakage current suppression for hybrid-Schottky/ohmic drain AlGaN/GaN HEMT

Tang, Cen, Xie, Gang, Sheng, Kuang
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Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.10.018
Date:
February, 2015
File:
PDF, 2.01 MB
english, 2015
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