![](/img/cover-not-exists.png)
Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices
Wespel, M., Baeumler, M., Polyakov, V., Dammann, M., Reiner, R., Waltereit, P., Quay, R., Mikulla, M., Ambacher, O.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.09.016
Date:
December, 2014
File:
PDF, 1.34 MB
english, 2014