Influence of surface states on the voltage robustness of...

Microelectronics Reliability 2014 / 12 Vol. 54; Iss. 12

Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices

Wespel, M., Baeumler, M., Polyakov, V., Dammann, M., Reiner, R., Waltereit, P., Quay, R., Mikulla, M., Ambacher, O.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.09.016
Date:
December, 2014
File:
PDF, 1.34 MB
english, 2014
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