Volume 54; Issue 12

Microelectronics Reliability

Volume 54; Issue 12

1

Degradation transformation in spinel-type functional thick-film ceramic materials

Klym, H., Balitska, V., Shpotyuk, O., Hadzaman, I.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 963 KB

english, 2014

2

A review of HVI technology

Qiao, Ming, Zhang, Xin, Wen, Shuai, Zhang, Bo, Li, Zhaoji

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 3.79 MB

english, 2014

3

Markov process based reliability model for laser diodes in space radiation environment

Liu, Yun, Zhao, Shanghong, Yang, Shengsheng, Li, Yongjun, Qiang, Ruoxin

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 387 KB

english, 2014

4

Impact of bias conditions on performance degradation in SiGe HBTs irradiated by 10MeV Br ion

Sun, Yabin, Fu, Jun, Xu, Jun, Wang, Yudong, Zhou, Wei, Zhang, Wei, Cui, Jie, Li, Gaoqing, Liu, Zhihong

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.20 MB

english, 2014

5

A yield improvement technique in severe process, voltage, and temperature variations and extreme voltage scaling

Radfar, Mohsen, Singh, Jack

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 5.04 MB

english, 2014

6

Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics

Vidor, F.F., Wirth, G.I., Hilleringmann, U.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 940 KB

english, 2014

7

Junction temperature management of IGBT module in power electronic converters

Zhou, Luowei, Wu, Junke, Sun, Pengju, Du, Xiong

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.02 MB

english, 2014

8

Influence of the surface roughness of the bottom electrode on the resistive-switching characteristics of Al/Al2O3/Al and Al/Al2O3/W structures fabricated on glass at 300°C

Molina, Joel, Valderrama, Rene, Zuniga, Carlos, Rosales, Pedro, Calleja, Wilfrido, Torres, Alfonso, DeLa Hidalga, Javier, Gutierrez, Edmundo

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.38 MB

english, 2014

9

Mechanical and electrical properties of ultra-thin chips and flexible electronics assemblies during bending

van den Ende, D.A., van de Wiel, H.J., Kusters, R.H.L., Sridhar, A., Schram, J.F.M., Cauwe, M., van den Brand, J.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 3.03 MB

english, 2014

10

Effects of PCBM concentration on the electrical properties of the Au/P3HT:PCBM/n-Si (MPS) Schottky barrier diodes

Tüzün Özmen, Özge

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 605 KB

english, 2014

11

Interval optimal design of 3-D TSV stacked chips package reliability by using the genetic algorithm method

Cheng, Hsin-En, Chen, Rong-Sheng

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 6.41 MB

english, 2014

12

Low-cycle fatigue failure behavior and life evaluation of lead-free solder joint under high temperature

Zhu, Yongxin, Li, Xiaoyan, Gao, Ruiting, Wang, Chao

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.50 MB

english, 2014

13

Modeling and simulation of power electronic modules with microchannel coolers for thermo-mechanical performance

Xu, Ling, Liu, Yong, Liu, Sheng

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 4.44 MB

english, 2014

14

Design and analysis of noise margin, write ability and read stability of organic and hybrid 6-T SRAM cell

Kumar, Brijesh, Kaushik, Brajesh Kumar, Negi, Yuvraj Singh

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.61 MB

english, 2014

15

Reliability matrix solution to multiple mechanism prediction

Bernstein, Joseph B., Gabbay, Moti, Delly, Ofir

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 347 KB

english, 2014

16

Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology

Weng, Ming-Hung, Chen, Chao-Hung, Lin, Che-Kai, Huang, Shih-Hui, Du, Jhih-Han, Peng, Sheng-Wen, Wohlmuth, Walter, Chou, Frank Yung-Shi, Hua, Chang-Hwang

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.38 MB

english, 2014

17

Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices

Wespel, M., Baeumler, M., Polyakov, V., Dammann, M., Reiner, R., Waltereit, P., Quay, R., Mikulla, M., Ambacher, O.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.34 MB

english, 2014

18

Low cycle fatigue performance of ball grid array structure Cu/Sn–3.0Ag–0.5Cu/Cu solder joints

Qin, H.B., Li, W.Y., Zhou, M.B., Zhang, X.P.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 4.01 MB

english, 2014

19

Direct correlation between reliability and pH changes of phosphors for white light-emitting diodes

Choi, Minho, Kim, Ki Hyun, Yun, Changhun, Koo, Dai Hyoung, Song, Sang Bin, Kim, Jae Pil

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 696 KB

english, 2014

20

The transient analysis of latch-up in CMOS transmission gate induced by laser

Qiu, Weicheng, Cheng, Xiang-Ai, Wang, Rui, Xu, Zhongjie, Shen, Chao

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.18 MB

english, 2014

21

An investigation of the reliability of solderable ICA with low-melting-point alloy (LMPA) filler

Yim, Byung-Seung, Lee, Jeong Il, Lee, Byung Hun, Shin, Young-Eui, Kim, Jong-Min

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.99 MB

english, 2014

22

Aging characteristics of ZnO–V2O5-based varistors for surge protection reliability

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.60 MB

english, 2014

23

Nanotribological properties of ALD-processed bilayer TiO2/ZnO films

Wang, Wun-Kai, Wen, Hua-Chiang, Cheng, Chun-Hu, Hung, Ching-Hua, Chou, Wu-Ching, Yau, Wei-Hung, Yang, Ping-Feng, Lai, Yi-Shao

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.34 MB

english, 2014

24

Editorial

Ersland, Peter, Menozzi, Roberto

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 176 KB

english, 2014

25

Implications of gate-edge electric field in AlGaN/GaN high electron mobility transistors during OFF-state degradation

Sun, H., Montes Bajo, M., Uren, M.J., Kuball, M.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.86 MB

english, 2014

26

Implications of thermal instability on HBT power amplifier reliability

Chivukula, Venkata, Teeter, Douglas, Scott, Preston, Shah, Bhavin, Ji, Ming

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.74 MB

english, 2014

27

Analysis and resolution of a thermally accelerated early life failure mechanism in a 40V GaN FET

Gajewski, Donald A., Lewis, Randall D., Decker, Benjamin M.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.94 MB

english, 2014

28

Activation energy of drain-current degradation in GaN HEMTs under high-power DC stress

Wu, Yufei, Chen, Chia-Yu, del Alamo, Jesús A.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 847 KB

english, 2014

29

Fatigue life evaluation of wire bonds in LED packages using numerical analysis

Zhang, Sung-Uk, Lee, Bang Weon

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.38 MB

english, 2014

30

Decrease in on-state gate current of AlGaN/GaN HEMTs by recombination-enhanced defect reaction of generated hot carriers investigated by TCAD simulation

Sasaki, Hajime, Kadoiwa, Kaoru, Koyama, Hidetoshi, Kamo, Yoshitaka, Yamamoto, Yoshitsugu, Oishi, Toshiyuki, Hayashi, Kazuo

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 942 KB

english, 2014

31

Failure analysis and improvement of 60V power UMOSFET

Wang, Debo, Feng, Quanyuan, Chen, Xiaopei, Jin, Tao

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.26 MB

english, 2014

32

The roles of dendritic spacings and Ag3Sn intermetallics on hardness of the SAC307 solder alloy

Silva, Bismarck Luiz, Garcia, Amauri, Spinelli, José Eduardo

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 841 KB

english, 2014

33

Impact of gate metal work-function engineering for enhancement of subthreshold analog/RF performance of underlap dual material gate DG-FET

Kundu, Atanu, Koley, Kalyan, Dutta, Arka, Sarkar, Chandan K.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.91 MB

english, 2014

34

An investigation into warpages, stresses and keep-out zone in 3D through-silicon-via DRAM packages

Tsai, M.Y., Huang, P.S., Huang, C.Y., Lin, P.C., Huang, Lawrence, Chang, Michael, Shih, Steven, Lin, J.P.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.89 MB

english, 2014

35

Predicting conducting yarn failure in woven electronic textiles

de Vries, Hans, Peerlings, Ron

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 948 KB

english, 2014

36

Methodology for accurate extrapolation of InGaP/GaAs HBT safe operating area (SOA) for variations in emitter area and ballast resistor size

Howell, Robert S., Lewis, Randall, Henry, H. George, Hearne, Harold, Brown, Deas, Dawson, Dale, Ezis, Andris

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.09 MB

english, 2014

37

Simulation of flicker noise in gate-all-around Silicon Nanowire MOSFETs including interface traps

Anandan, P., Nithya, A., Mohankumar, N.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 507 KB

english, 2014

38

Customized glass sealant for ceramic substrates for high temperature electronic application

Sharif, Ahmed, Gan, Chee Lip, Chen, Zhong

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.69 MB

english, 2014

39

Effect of electron irradiation on morphological, compositional and electrical properties of nanocluster carbon thin films grown using room temperature based cathodic arc process for large area microelectronics

De, Shounak, Satyanarayana, B.S., Sanjeev, Ganesh, Ramakrishna, K., Mohan Rao, K., Pattabi, Manjunatha

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.14 MB

english, 2014

40

Mechanical and environmental durability of roll-to-roll printed silver nanoparticle film using a rapid laser annealing process for flexible electronics

Yang, Min, Chon, Min-Woo, Kim, Joo-Hyun, Lee, Seung-Hyun, Jo, Jeongdai, Yeo, Junyeob, Ko, Seung Hwan, Choa, Sung-Hoon

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 3.39 MB

english, 2014

41

Improving the power cycling performance of the emitter contact of IGBT modules: Implementation and evaluation of stitch bond layouts

Özkol, Emre, Hartmann, Samuel, Pâques, Gontran

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.00 MB

english, 2014

42

High-speed video analysis for kink formation in a bond wire looping

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.99 MB

english, 2014

43

Inside front cover - Editorial board

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 38 KB

english, 2014

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Tor version

Z-Library

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски