The transient analysis of latch-up in CMOS transmission...

Microelectronics Reliability 2014 / 12 Vol. 54; Iss. 12

The transient analysis of latch-up in CMOS transmission gate induced by laser

Qiu, Weicheng, Cheng, Xiang-Ai, Wang, Rui, Xu, Zhongjie, Shen, Chao
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.08.014
Date:
December, 2014
File:
PDF, 1.18 MB
english, 2014
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