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Effects of nitridation and annealing on interface...

Effects of nitridation and annealing on interface properties of thermally oxidized SiO[sub 2]/SiC metal–oxide–semiconductor system

Lai, P. T., Chakraborty, Supratic, Chan, C. L., Cheng, Y. C.
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Volume:
76
Year:
2000
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.126769
File:
PDF, 293 KB
english, 2000
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