Impact of gate metal work-function engineering for enhancement of subthreshold analog/RF performance of underlap dual material gate DG-FET
Kundu, Atanu, Koley, Kalyan, Dutta, Arka, Sarkar, Chandan K.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.08.009
Date:
December, 2014
File:
PDF, 1.91 MB
english, 2014