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Methodology for accurate extrapolation of InGaP/GaAs HBT...

Microelectronics Reliability 2014 / 12 Vol. 54; Iss. 12

Methodology for accurate extrapolation of InGaP/GaAs HBT safe operating area (SOA) for variations in emitter area and ballast resistor size

Howell, Robert S., Lewis, Randall, Henry, H. George, Hearne, Harold, Brown, Deas, Dawson, Dale, Ezis, Andris
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.09.018
Date:
December, 2014
File:
PDF, 2.09 MB
english, 2014
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