![](/img/cover-not-exists.png)
Activation energy for electromigration failure in Al–Cu conductor stripes covered with polyimide
Lloyd, J. R., Steagall, R. N.Volume:
60
Year:
1986
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.337325
File:
PDF, 419 KB
english, 1986