Investigation of trap emission kinetics in...

Investigation of trap emission kinetics in metal-oxide-semiconductor capacitors using a pump-probe charge integrating technique

Poler, J. C., Irene, E. A.
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Volume:
75
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.356229
File:
PDF, 1.38 MB
english, 1994
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