A Silicon-Level Countermeasure Against Fault Sensitivity...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015 / 8 Vol. 23; Iss. 8

A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation

Endo, Sho, Li, Yang, Homma, Naofumi, Sakiyama, Kazuo, Ohta, Kazuo, Fujimoto, Daisuke, Nagata, Makoto, Katashita, Toshihiro, Danger, Jean-Luc, Aoki, Takafumi
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Volume:
23
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2014.2339892
Date:
August, 2015
File:
PDF, 4.84 MB
english, 2015
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