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A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation
Endo, Sho, Li, Yang, Homma, Naofumi, Sakiyama, Kazuo, Ohta, Kazuo, Fujimoto, Daisuke, Nagata, Makoto, Katashita, Toshihiro, Danger, Jean-Luc, Aoki, TakafumiVolume:
23
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2014.2339892
Date:
August, 2015
File:
PDF, 4.84 MB
english, 2015