Statistical Retardation Delay of I-MOS and Its Measurement...

IEEE Electron Device Letters 2011 / 02 Vol. 32; Iss. 2

Statistical Retardation Delay of I-MOS and Its Measurement Using TDR

Cho, Hyunbo, Onal, Caner, Griffin, Peter B., Plummer, James D.
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Volume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2090491
Date:
February, 2011
File:
PDF, 239 KB
english, 2011
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