Interfacial Failure in Flexible Electronic Devices

IEEE Electron Device Letters 2014 / 01 Vol. 35; Iss. 1

Interfacial Failure in Flexible Electronic Devices

Chen, Hang, Lu, Bing-Wei, Lin, Yuan, Feng, Xue
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Volume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2289932
Date:
January, 2014
File:
PDF, 404 KB
english, 2014
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