Limiting Upset Cross Sections of SEU Hardened SOI SRAMs
Liu, Michael S., Liu, Harry Y., Brewster, Nancy, Nelson, Dave, Golke, Keith W., Kirchner, Gary, Hughes, Harold L., Campbell, Arthur, Ziegler, James F.Volume:
53
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2006.886216
Date:
December, 2006
File:
PDF, 1.10 MB
english, 2006