Characterization of DX centers in selectively doped...

Applied Physics Letters 1990 Vol. 57; Iss. 13

Characterization of DX centers in selectively doped GaAs-AlAs superlattices

Ababou, S., Marchand, J. J., Mayet, L., Guillot, G., Mollot, F.
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Volume:
57
Year:
1990
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.103471
File:
PDF, 479 KB
english, 1990
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