The role of damage in post-emission of electrons from...

Journal of Applied Physics 1989 Vol. 65; Iss. 5

The role of damage in post-emission of electrons from cleavage surfaces of single-crystal LiF

Mathison, J. P., Langford, S. C., Dickinson, J. T.
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Volume:
65
Year:
1989
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.342878
File:
PDF, 1.02 MB
english, 1989
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