Embedded deterministic test for low-cost manufacturing

IEEE Design & Test of Computers 2003 / 09 Vol. 20; Iss. 5

Embedded deterministic test for low-cost manufacturing

Rajski, J., Kassab, M., Mukherjee, N., Tamarapalli, N., Tyszer, J., Jun Qian,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2003.1232257
Date:
September, 2003
File:
PDF, 279 KB
english, 2003
Conversion to is in progress
Conversion to is failed