Impact of the lateral straggle on the Analog and RF...

Microelectronics Reliability 2015 / 02 Vol. 55; Iss. 2

Impact of the lateral straggle on the Analog and RF performance of TFET

Ghosh, Sayani, Koley, Kalyan, Sarkar, Chandan K.
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Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.10.008
Date:
February, 2015
File:
PDF, 1023 KB
english, 2015
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