Effect of bias on thermally stimulated current (TSC) in...

IEEE Transactions on Nuclear Science 1991 / Dec. Vol. 38; Iss. 6

Effect of bias on thermally stimulated current (TSC) in irradiated MOS devices

Fleetwood, D.M., Reber, R.A., Winokur, P.S.
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Volume:
38
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.124076
Date:
January, 1991
File:
PDF, 1.26 MB
english, 1991
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