Correction to "Investigation of charge loss mechanism...

IEEE Electron Device Letters 2013 / 09 Vol. 34; Iss. 9

Correction to "Investigation of charge loss mechanism of thickness-scalable trapping layer by variable temperature Kelvin probe force microscopy" [Jul 13 870-872]

Han, Yulong, Huo, Zongliang, Li, Xinkai, Chen, Guoxing, Yang, Xiaonan, Zhang, Dong, Wang, Yong, Ye, Tianchun, Liu, Ming
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2277653
Date:
September, 2013
File:
PDF, 70 KB
english, 2013
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