Reduction of Ohmic Contact Resistance of Solid Phase...

IEEE Electron Device Letters 2013 / 09 Vol. 34; Iss. 9

Reduction of Ohmic Contact Resistance of Solid Phase Regrowth Contacts to n-InGaAs Using a Sulfur Pretreatment

Yearsley, Joshua D., Lin, Joyce C., Mohney, Suzanne E.
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2274526
Date:
September, 2013
File:
PDF, 238 KB
english, 2013
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