Comparison of the sensitivity to heavy ions of SRAM's in...

IEEE Electron Device Letters 1994 / 03 Vol. 15; Iss. 3

Comparison of the sensitivity to heavy ions of SRAM's in different SIMOX technologies

Ferlet-Cavrois, V., Musseau, O., Leray, J.L., Coic, Y.M., Lecarval, G., Guichard, E.
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Volume:
15
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.285395
Date:
March, 1994
File:
PDF, 223 KB
english, 1994
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