Volume 15; Issue 3

IEEE Electron Device Letters

Volume 15; Issue 3

1

Suppression of boron penetration in p/sup +/ polysilicon gate P-MOSFETs using low-temperature gate-oxide N/sub 2/O anneal

Ma, Z.J., Chen, J.C., Liu, Z.H., Krick, J.T., Cheng, Y.C., Hu, C., Ko, P.K.

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 324 KB

english, 1994

2

Electron mobility enhancement in strained-Si n-type metal-oxide-semiconductor field-effect transistors

Welser, J., Hoyt, J.L., Gibbons, J.F.

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 311 KB

english, 1994

3

Photoresponse model for Si/sub 1/spl minus/x/Ge/sub x//Si heterojunction internal photoemission infrared detector

T. Lin, J. Park, S. Gunapala, E. Jones, H. Del Castillo

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 269 KB

english, 1994

4

AlGaAs/GaAs/AlGaAs DHBT's for high-temperature stable circuits

K. Fricke, H. Hartnagel, W. Lee, M. Schussler

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 296 KB

english, 1994

5

Hydrogen permeation, Si defect generation, and their interaction during CHF/sub 3//O/sub 2/ contact etching

Awadelkarim, O.O., Mikulan, P.I., Gu, T., Ditizio, R.A., Fonash, S.J.

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 289 KB

english, 1994

6

Ultra-high-speed InP/InGaAs heterojunction bipolar transistors

Jong-In Song,, Hong, B.W.-P., Palmstrom, C.J., Van Der Gaag, B.P., Chough, K.B.

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 278 KB

english, 1994

7

Enhancing the brightness of thin-film electroluminescent displays by improving the emission process

Stevens, R., Thomas, C.B., Cranton, W.M.

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 276 KB

english, 1994

8

Comparison of the sensitivity to heavy ions of SRAM's in different SIMOX technologies

Ferlet-Cavrois, V., Musseau, O., Leray, J.L., Coic, Y.M., Lecarval, G., Guichard, E.

Journal:

IEEE Electron Device Letters

Year:

1994

Language:

english

File:

PDF, 223 KB

english, 1994

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