Power-Rail ESD Clamp Circuit With Diode-String ESD...

IEEE Transactions on Electron Devices 2013 / 10 Vol. 60; Iss. 10

Power-Rail ESD Clamp Circuit With Diode-String ESD Detection to Overcome the Gate Leakage Current in a 40-nm CMOS Process

Altolaguirre, Federico Agustin, Ker, Ming-Dou
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2274701
Date:
October, 2013
File:
PDF, 3.23 MB
english, 2013
Conversion to is in progress
Conversion to is failed