Improved Off-State Reliability of Nonvolatile Resistive Switch With Low Programming Voltage
Tada, Munehiro, Sakamoto, Toshitsugu, Miyamura, Makoto, Banno, Naoki, Okamoto, Koichiro, Iguchi, Noriyuki, Hada, HiromitsuVolume:
59
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2012.2204263
Date:
September, 2012
File:
PDF, 864 KB
english, 2012