Unified Analytic Model for Current–Voltage Behavior in...

IEEE Electron Device Letters 2014 / 01 Vol. 35; Iss. 1

Unified Analytic Model for Current–Voltage Behavior in Amorphous Oxide Semiconductor TFTs

Lee, Sungsik, Striakhilev, Denis, Jeon, Sanghun, Nathan, Arokia
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Volume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2290532
Date:
January, 2014
File:
PDF, 838 KB
english, 2014
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