Internal Bias Field in Ferroelectric Polymer Thin Film for Nonvolatile Memory Applications
Woo Young Kim,, Du Youn Ka,, Dong Soo Kim,, Il Woong Kwon,, Sang Youl Kim,, Yong Soo Lee,, Hee Chul Lee,Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2042676
Date:
May, 2010
File:
PDF, 365 KB
english, 2010