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Measurement and control of ion-doping-induced defects in cadmium telluride films
Kim, Donghwan, Fahrenbruch, Alan L., Lopez-Otero, Adolfo, Bube, Richard H., Jones, Kim M.Volume:
75
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.356220
File:
PDF, 1.16 MB
english, 1994