The influence of ion beam mixed TiSi2 layers on reverse characteristics of diodes
Dehm, C., Burte, E. P., Gyulai, J., Zimmermann, H.Volume:
71
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.350796
File:
PDF, 805 KB
english, 1992