The influence of ion beam mixed TiSi2 layers on reverse...

The influence of ion beam mixed TiSi2 layers on reverse characteristics of diodes

Dehm, C., Burte, E. P., Gyulai, J., Zimmermann, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
71
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.350796
File:
PDF, 805 KB
english, 1992
Conversion to is in progress
Conversion to is failed