![](/img/cover-not-exists.png)
Temperature dependence of the current in SiO2 in the high field tunneling regime
Ricco, B., Fischetti, M. V.Volume:
55
Year:
1984
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.333044
File:
PDF, 827 KB
english, 1984