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Analytical Theory for Extracting Specific Contact Resistances of Thick Samples From the Transmission Line Method
Eidelloth, Stefan, Brendel, RolfVolume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2290602
Date:
January, 2014
File:
PDF, 311 KB
english, 2014