Analytical Theory for Extracting Specific Contact...

IEEE Electron Device Letters 2014 / 01 Vol. 35; Iss. 1

Analytical Theory for Extracting Specific Contact Resistances of Thick Samples From the Transmission Line Method

Eidelloth, Stefan, Brendel, Rolf
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Volume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2290602
Date:
January, 2014
File:
PDF, 311 KB
english, 2014
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