![](/img/cover-not-exists.png)
Refractive index determination of materials on thin transparent substrates using ellipsometry
Lévesque, LVolume:
35
Language:
english
Journal:
Physics Education
DOI:
10.1088/0031-9120/35/5/309
Date:
September, 2000
File:
PDF, 104 KB
english, 2000