Refractive index determination of materials on thin...

Refractive index determination of materials on thin transparent substrates using ellipsometry

Lévesque, L
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Volume:
35
Language:
english
Journal:
Physics Education
DOI:
10.1088/0031-9120/35/5/309
Date:
September, 2000
File:
PDF, 104 KB
english, 2000
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