Reliability of laser-induced metallic vertical links

Wei Zhang,, Joo-Han Lee,, Yuan Chen,, Bernstein, J.B., Suehle, J.S.

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Volume:

Language:

english

Journal:

IEEE Transactions on Advanced Packaging

DOI:

10.1109/6040.803453

Date:

January, 1999

File:

PDF, 300 KB

english, 1999

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