A single event latchup suppression technique for COTS CMOS ICs
Spratt, J.P., Pickel, J.C., Leadon, R.E., Lacoe, R.C., Moss, S.C., LaLumondiere, S.D.Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821607
Date:
December, 2003
File:
PDF, 1.11 MB
english, 2003