Simplistic Simulation-Based Device-VT-Targeting Technique...

IEEE Transactions on Electron Devices 2015 / 6 Vol. 62; Iss. 6

Simplistic Simulation-Based Device-VT-Targeting Technique to Determine Technology High-Density LELE-Gate-Patterned FinFET SRAM in Sub-10 nm Era

Sakhare, Sushil Sudam, Miyaguchi, Kenichi, Raghavan, Praveen, Mercha, Abdelkarim
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2368358
Date:
June, 2015
File:
PDF, 3.27 MB
english, 2015
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