Time-dependent degradation of MOSFET channel mobility...

IEEE Transactions on Nuclear Science 1989 / Dec. Vol. 36; Iss. 6

Time-dependent degradation of MOSFET channel mobility following pulsed irradiation

McLean, F.B., Boesch, H.E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45369
Date:
January, 1989
File:
PDF, 1.28 MB
english, 1989
Conversion to is in progress
Conversion to is failed