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Applicability of circuit macromodeling to analog single-event transient analysis
Boulghassoul, Y., Rowe, J.D., Massengill, L.W.Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821393
Date:
December, 2003
File:
PDF, 444 KB
english, 2003