Applicability of circuit macromodeling to analog...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Applicability of circuit macromodeling to analog single-event transient analysis

Boulghassoul, Y., Rowe, J.D., Massengill, L.W.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821393
Date:
December, 2003
File:
PDF, 444 KB
english, 2003
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