A practical metric for soft error vulnerability analysis of combinational circuits
Raji, Mohsen, Pedram, Hossein, Ghavami, BehnamVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.11.004
Date:
February, 2015
File:
PDF, 1.05 MB
english, 2015