Select Device Disturb Phenomenon in TANOS NAND Flash...

IEEE Electron Device Letters 2009 / 05 Vol. 30; Iss. 5

Select Device Disturb Phenomenon in TANOS NAND Flash Memories

Melde, Thomas, Beug, Marc Florian, Bach, Lars, Tilke, Armin Thomas, Knoefler, Roman, Bewersdorff-Sarlette, Ulrike, Beyer, Volkhard, Czernohorsky, Malte, Paul, Jan, Mikolajick, Thomas
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Volume:
30
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2017497
Date:
May, 2009
File:
PDF, 337 KB
english, 2009
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