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Volume 30; Issue 5
Main
IEEE Electron Device Letters
Volume 30; Issue 5
IEEE Electron Device Letters
Volume 30; Issue 5
1
Sub-1-K Operation of SiGe Transistors and Circuits
Najafizadeh, L.
,
Adams, J.S.
,
Phillips, S.D.
,
Moen, K.A.
,
Cressler, J.D.
,
Aslam, S.
,
Stevenson, T.R.
,
Meloy, R.M.
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 251 KB
Your tags:
english, 2009
2
Vertically Stacked Silicon Nanowire Transistors Fabricated by Inductive Plasma Etching and Stress-Limited Oxidation
Ng, R.M.Y.
,
Tao Wang
,
Feng Liu
,
Xuan Zuo
,
Jin He
,
Mansun Chan
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 392 KB
Your tags:
english, 2009
3
Stackable All-Oxide-Based Nonvolatile Memory With Antifuse and Diode
Seung-Eon Ahn
,
Bo Soo Kang
,
Ki Hwan Kim
,
Myoung-Jae Lee
,
Chang Bum Lee
,
Stefanovich, G.
,
Chang Jung Kim
,
Youngsoo Park
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 338 KB
Your tags:
english, 2009
4
A Study on the Failure Mechanism of a Phase-Change Memory in Write/Erase Cycling
Suyoun Lee
,
Jeung-hyun Jeong
,
Taek Sung Lee
,
Won Mok Kim
,
Byung-ki Cheong
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 428 KB
Your tags:
english, 2009
5
Localized Damage in AlGaN/GaN HEMTs Induced by Reverse-Bias Testing
Zanoni, E.
,
Danesin, F.
,
Meneghini, M.
,
Cetronio, A.
,
Lanzieri, C.
,
Peroni, M.
,
Meneghesso, G.
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 303 KB
Your tags:
english, 2009
6
A Low-Parasitic and Common-Centroid Cross-Coupled CMOS Transistor Structure for High-Frequency VCO Design
In-Young Lee,
,
Seok-Ju Yun,
,
Seung-Min Oh,
,
Sang-Gug Lee,
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 375 KB
Your tags:
english, 2009
7
Graphene Frequency Multipliers
Han Wang,
,
Nezich, D.
,
Jing Kong,
,
Palacios, T.
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 139 KB
Your tags:
english, 2009
8
Effective-Work-Function Control by Varying the TiN Thickness in Poly-Si/TiN Gate Electrodes for Scaled High- $k$ CMOSFETs
Kadoshima, M.
,
Matsuki, T.
,
Miyazaki, S.
,
Shiraishi, K.
,
Chikyo, T.
,
Yamada, K.
,
Aoyama, T.
,
Nara, Y.
,
Ohji, Y.
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 166 KB
Your tags:
english, 2009
9
RF Transmission Line Method for Wide-Bandgap Heterostructures
Koudymov, A.
,
Pala, N.
,
Tokranov, V.
,
Oktyabrsky, S.
,
Gaevski, M.
,
Jain, R.
,
Yang, J.
,
Hu, X.
,
Shur, M.
,
Gaska, R.
,
Simin, G.
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 142 KB
Your tags:
english, 2009
10
Very High Field-Emission Current From a Carbon-Nanotube Cathode With a Pulse Driving Mode
Lei Wei,
,
Zhang Xiaobing,
,
Lou Chaogang,
,
Zhao Zhiwei,
,
Wang Baoping,
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 267 KB
Your tags:
english, 2009
11
Magnetic-Field Sensitivity Enhancement by Magnetoelectric Sensor Arrays
Zengping Xing,
,
Junyi Zhai,
,
Junqi Gao,
,
Jiefang Li,
,
Viehland, D.
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 200 KB
Your tags:
english, 2009
12
A Silicon MEMS DC/DC Converter for Autonomous Vibration-to-Electrical-Energy Scavenger
Paracha, A.M.
,
Basset, P.
,
Galayko, D.
,
Marty, F.
,
Bourouina, T.
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 288 KB
Your tags:
english, 2009
13
Effective Modulation of Quadratic Voltage Coefficient of Capacitance in MIM Capacitors Using $\hbox{Sm}_{2}\hbox{O}_{3}/\hbox{SiO}_{2}$ Dielectric Stack
Jian-Jun Yang,
,
Jing-De Chen,
,
Wise, R.
,
Steinmann, P.
,
Ming-Bin Yu,
,
Dim-Lee Kwong,
,
Ming-Fu Li,
,
Yee-Chia Yeo,
,
Chunxiang Zhu
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 409 KB
Your tags:
english, 2009
14
An Efficient Triple-Tandem Polymer Solar Cell
D. Zhao
,
X. Sun
,
C. Jiang
,
A. Kyaw
,
G. Lo
,
D. Kwong
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 319 KB
Your tags:
english, 2009
15
On the Temperature and Field Dependence of Trap-Assisted Tunneling Current in Ge $\hbox{p}^{+}\hbox{n}$ Junctions
E. Simoen
,
F. De Stefano
,
G. Eneman
,
B. De Jaeger
,
C. Claeys
,
F. Crupi
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 170 KB
Your tags:
english, 2009
16
A Novel Approach for Stability Analysis in Carbon Nanotube Interconnects
Fathi, Davood
,
Forouzandeh, Behjat
Journal:
IEEE Electron Device Letters
Year:
2009
Language:
english
File:
PDF, 303 KB
Your tags:
english, 2009
17