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Statistical Interactions of Multiple Oxide Traps Under BTI Stress of Nanoscale MOSFETs
Markov, Stanislav, Amoroso, Salvatore Maria, Gerrer, Louis, Adamu-Lema, Fikru, Asenov, AsenVolume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2253541
Date:
May, 2013
File:
PDF, 764 KB
english, 2013