Statistical Interactions of Multiple Oxide Traps Under BTI...

IEEE Electron Device Letters 2013 / 05 Vol. 34; Iss. 5

Statistical Interactions of Multiple Oxide Traps Under BTI Stress of Nanoscale MOSFETs

Markov, Stanislav, Amoroso, Salvatore Maria, Gerrer, Louis, Adamu-Lema, Fikru, Asenov, Asen
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2253541
Date:
May, 2013
File:
PDF, 764 KB
english, 2013
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