Fabrication and Characterization of Low-Temperature...

IEEE Electron Device Letters 2010 / 05 Vol. 31; Iss. 5

Fabrication and Characterization of Low-Temperature Poly-Silicon Lateral p-i-n Diode

Se Hwan Kim,, Seung Hoon Lee,, Jin Jang,
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Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2043047
Date:
May, 2010
File:
PDF, 355 KB
english, 2010
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