Impact of poly-gate depletion on MOS RF linearity
Chang-Hoon Choi,, Zhiping Yu,, Dutton, R.W.Volume:
24
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2003.812549
Date:
May, 2003
File:
PDF, 253 KB
english, 2003