AMLCD flicker model considering the V/sub T/ shift in...

IEEE Transactions on Device and Materials Reliability 2003 / 12 Vol. 3; Iss. 4

AMLCD flicker model considering the V/sub T/ shift in a-Si:H TFT

Chung-Che Huang,, Constable, J.H., Yost, B., Greene, R.G.
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Volume:
3
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2003.817676
Date:
December, 2003
File:
PDF, 1.11 MB
english, 2003
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