![](/img/cover-not-exists.png)
AMLCD flicker model considering the V/sub T/ shift in a-Si:H TFT
Chung-Che Huang,, Constable, J.H., Yost, B., Greene, R.G.Volume:
3
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2003.817676
Date:
December, 2003
File:
PDF, 1.11 MB
english, 2003