An Experimental Study on High-Frequency Substrate Noise...

IEEE Electron Device Letters 2008 / 03 Vol. 29; Iss. 3

An Experimental Study on High-Frequency Substrate Noise Isolation in BiCMOS Technology

Yeh, Ping-Chun, Chiou, Hwann-Kaeo, Lee, Chwan-Ying, Yeh, John, Tang, Denny, Chern, John
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Volume:
29
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.915383
Date:
March, 2008
File:
PDF, 572 KB
english, 2008
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