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An Experimental Study on High-Frequency Substrate Noise Isolation in BiCMOS Technology
Yeh, Ping-Chun, Chiou, Hwann-Kaeo, Lee, Chwan-Ying, Yeh, John, Tang, Denny, Chern, JohnVolume:
29
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.915383
Date:
March, 2008
File:
PDF, 572 KB
english, 2008