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Volume 29; Issue 3
Main
IEEE Electron Device Letters
Volume 29; Issue 3
IEEE Electron Device Letters
Volume 29; Issue 3
1
Crosstalk Characterization in Geiger-Mode Avalanche Photodiode Arrays
Sciacca, E.
,
Condorelli, G.
,
Aurite, S.
,
Lombardo, S.
,
Mazzillo, M.
,
Sanfilippo, D.
,
Fallica, G.
,
Rimini, E.
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 331 KB
Your tags:
english, 2008
2
Low Subthreshold Swing HfLaO/Pentacene Organic Thin-Film Transistors
Chang, M.F.
,
Lee, P.T.
,
McAlister, S.P.
,
Chin, A.
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 122 KB
Your tags:
english, 2008
3
Vertical Enhancement-Mode InAs Nanowire Field-Effect Transistor With 50-nm Wrap Gate
Thelander, C.
,
FrobergFroberg, L.E.
,
Rehnstedt, C.
,
Samuelson, L.
,
Wernersson, L.-E.
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 333 KB
Your tags:
english, 2008
4
Thin Amorphous $\hbox{Si/Si}_{3}\hbox{N}_{4}$-Based Light-Emitting Device Prepared With Low Thermal Budget
Tan, W.K.
,
Yu, M.B.
,
Chen, Q.
,
Loh, W.Y.
,
Ye, J.D.
,
Zhang, X.H.
,
Lo, G.Q.
,
Kwong, D.-L.
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 319 KB
Your tags:
english, 2008
5
Accurate Estimation of Low $( ≪ \hbox{10}^{-8}\ \Omega \cdot \hbox{cm}^{2})$ Values of Specific Contact Resistivity
Bhaskaran, M.
,
Sriram, S.
,
Holland, A.S.
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 275 KB
Your tags:
english, 2008
6
1.4-$\mu\hbox{m}$-Pitch 50% Fill-Factor 1T Charge-Modulation Pixel for CMOS Image Sensors
A. Tournier
,
F. Roy
,
G. Lu
,
B. Deschamps
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 472 KB
Your tags:
english, 2008
7
Effects of $\hbox{N}_{2}$ Plasma Pretreatment on the SiN Passivation of AlGaN/GaN HEMT
M. Romero
,
A. Jimenez
,
J. Miguel-sanchez
,
A. Brana
,
F. Gonzalez-posada
,
R. Cuerdo
,
F. Calle
,
E. Munoz
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 133 KB
Your tags:
english, 2008
8
Ti/Ni(80%)Cr(20%) Thin-Film Resistor With a Nearly Zero Temperature Coefficient of Resistance for Integration in a Standard CMOS Process
D. Nachrodt
,
U. Paschen
,
A. Ten Have
,
H. Vogt
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 288 KB
Your tags:
english, 2008
9
Inverted Staggered Poly-Si Thin-Film Transistor With Planarized SOG Gate Insulator
J. H. Cheon
,
J. H. Bae
,
J. Jang
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 313 KB
Your tags:
english, 2008
10
$muhbox{m}$ CMOS Technology]]>
Hsu Cheng-Ying,
,
Chen Chu-Yu,
,
Chuang Huey-Ru,
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 351 KB
Your tags:
english, 2008
11
Novel Offset-Gated Bottom Gate Poly-Si TFTs With a Combination Structure of Ultrathin Channel and Raised Source/Drain
Il-Suk Kang,
,
Shin-Hee Han,
,
Seung-Ki Joo,
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 217 KB
Your tags:
english, 2008
12
The Effect of Charge Imbalance on Superjunction Power Devices: An Exact Analytical Solution
Napoli, Ettore
,
Wang, Han
,
Udrea, Florin
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 120 KB
Your tags:
english, 2008
13
Room Temperature Near-Infrared Photoresponse Based on Interband Transitions in $\hbox{In}_{0.35}\hbox{Ga}_{0.65}\hbox{As}$ Multiple Quantum Dot Photodetector
Passmore, B.S.
,
Jiang Wu,
,
Manasreh, M.O.
,
Kunets, V.P.
,
Lytvyn, P.M.
,
Salamo, G.J.
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 528 KB
Your tags:
english, 2008
14
On the Formation of Positive Charges in Ultrathin Silicon-Oxynitride p-MOSFETs Subjected to Negative Bias Temperature Stress
Yangang Wang,
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 253 KB
Your tags:
english, 2008
15
Characteristics and Fluctuation of Negative Bias Temperature Instability in Si Nanowire Field-Effect Transistors
Runsheng Wang,
,
Ru Huang,
,
Yandong He,
,
Zhenhua Wang,
,
Gaosheng Jia,
,
Dong-Won Kim,
,
Donggun Park,
,
Yangyuan Wang,
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 253 KB
Your tags:
english, 2008
16
RF Capacitance Extraction Utilizing a Series Resistance Deembedding Scheme for Ultraleaky MOS Devices
Gil-Bok Choi,
,
Seung-Ho Hong,
,
Sung-Woo Jung,
,
Hee-Sung Kang,
,
Yoon-Ha Jeong,
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 292 KB
Your tags:
english, 2008
17
Operational Voltage Reduction of Flash Memory Using High-$\kappa$ Composite Tunnel Barriers
Verma, Sarves
,
Pop, Eric
,
Kapur, Pawan
,
Parat, Krishna
,
Saraswat, Krishna C.
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 182 KB
Your tags:
english, 2008
18
An Experimental Study on High-Frequency Substrate Noise Isolation in BiCMOS Technology
Yeh, Ping-Chun
,
Chiou, Hwann-Kaeo
,
Lee, Chwan-Ying
,
Yeh, John
,
Tang, Denny
,
Chern, John
Journal:
IEEE Electron Device Letters
Year:
2008
Language:
english
File:
PDF, 572 KB
Your tags:
english, 2008
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