Study of Local Power Dissipation in Ultrascaled Silicon...

IEEE Electron Device Letters 2015 / 1 Vol. 36; Iss. 1

Study of Local Power Dissipation in Ultrascaled Silicon Nanowire FETs

Martinez, Antonio, Barker, John R., Aldegunde, Manuel, Valin, Raul
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Volume:
36
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2014.2368357
Date:
January, 2015
File:
PDF, 453 KB
english, 2015
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