IEEE Electron Device Letters

1

Resistance Determination for Sub-100-nm Carbon Nanotube Vias

Zhou, Changjian, Vyas, Anshul A., Wilhite, Patrick, Wang, Phillip, Chan, Mansun, Yang, Cary Y.

Journal:

Year:

2015

Language:

english

File:

PDF, 407 KB

english, 2015

2

Top-Gate Dry-Etching Patterned Polymer Thin-Film Transistors With a Protective Layer on Top of the Channel

Tang, Wei, Zhao, Jiaqing, Feng, Linrun, Yu, Pengfei, Zhang, Weimin, Guo, Xiaojun

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 623 KB

english, 2015

3

Complementary SOI MESFETs at the 45-nm CMOS Node

Lepkowski, William, Wilk, Seth J., Thornton, Trevor J.

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 846 KB

english, 2015

4

Oxide Semiconductor Thin Film Transistors on Thin Solution-Cast Flexible Substrates

Li, Haoyu U., Jackson, Thomas N.

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1005 KB

english, 2015

5

Electrical Modeling of On-Chip Cu-Graphene Heterogeneous Interconnects

Zhao, Wen-Sheng, Wang, Da-Wei, Wang, Gaofeng, Yin, Wen-Yan

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 604 KB

english, 2015

6

Object-Property-Based Differential Eddy Current Gap Sensing Device

Wang, Luheng

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 211 KB

english, 2015

7

Study of Local Power Dissipation in Ultrascaled Silicon Nanowire FETs

Martinez, Antonio, Barker, John R., Aldegunde, Manuel, Valin, Raul

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 453 KB

english, 2015

8

Fully Depleted SOI Characterization by Capacitance Analysis of p-i-n Gated Diodes

Navarro, Carlos, Bawedin, Maryline, Andrieu, Francois, Cluzel, Jacques, Cristoloveanu, Sorin

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 885 KB

english, 2015

9

All-Metal-Nitride RRAM Devices

Zhang, Zhiping, Gao, Bin, Fang, Zheng, Wang, Xinpeng, Tang, Yanzhe, Sohn, Joon, Wong, H.-S. Philip, Wong, S. Simon, Lo, Guo-Qiang

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 682 KB

english, 2015

10

Frequency-Modulated Lorentz Force Magnetometer With Enhanced Sensitivity via Mechanical Amplification

Li, Mo, Nitzan, Sarah, Horsley, David A.

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 949 KB

english, 2015

11

Highly Stable ZnON Thin-Film Transistors With High Field-Effect Mobility Exceeding 50 $\mathrm{cm}^{2}$ /Vs

Ok, Kyung-Chul, Jeong, Hyun-Jun, Kim, Hyun-Suk, Park, Jin-Seong

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 724 KB

english, 2015

12

A Geometry Scalable Model for Nonlinear Thermal Impedance of Trench Isolated HBTs

Sahoo, Amit Kumar, Fregonese, Sebastien, Desposito, Rosario, Aufinger, Klaus, Maneux, Cristell, Zimmer, Thomas

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 804 KB

english, 2015

13

A Novel Mass Sensor Based on Nanomechanical Transistor

Jin, Leisheng, Li, Lijie

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 480 KB

english, 2015

14

94-GHz Large-Signal Operation of AlInN/GaN High-Electron-Mobility Transistors on Silicon With Regrown Ohmic Contacts

Marti, Diego, Tirelli, Stefano, Teppati, Valeria, Lugani, Lorenzo, Carlin, Jean-Francois, Malinverni, Marco, Grandjean, Nicolas, Bolognesi, C. R.

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 511 KB

english, 2015

15

0.5 V Supply Voltage Operation of In0.65Ga0.35As/GaAs0.4Sb0.6 Tunnel FET

Rajamohanan, Bijesh, Pandey, Rahul, Chobpattana, Varistha, Vaz, Canute, Gundlach, David, Cheung, Kin P., Suehle, John, Stemmer, Susanne, Datta, Suman

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 990 KB

english, 2015

16

Demonstration of Low Power 3-bit Multilevel Cell Characteristics in a TaOx-Based RRAM by Stack Engineering

Prakash, Amit, Park, Jaesung, Song, Jeonghwan, Woo, Jiyong, Cha, Eui-Jun, Hwang, Hyunsang

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.17 MB

english, 2015

17

Design Space of III-N Hot Electron Transistors Using AlGaN and InGaN Polarization-Dipole Barriers

Gupta, Geetak, Laurent, Matthew, Li, Haoran, Suntrup, Donald J., Acuna, Edwin, Keller, Stacia, Mishra, Umesh K.

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 654 KB

english, 2015

18

High-Responsivity and High-Sensitivity Graphene Dots/a-IGZO Thin-Film Phototransistor

Pei, Zingway, Lai, Hsin-Cheng, Wang, Jian-Yu, Chiang, Wei-Hung, Chen, Chien-Hsun

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.01 MB

english, 2015

19

Fabrication of a Hybrid Carbon-Based Composite for Flexible Heating Element With a Zero Temperature Coefficient of Resistance

Chu, Kunmo, Park, Sung-Hoon

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 685 KB

english, 2015

20

Extraction of Interface Trap Density in the Region Between Adjacent Wordlines in NAND Flash Memory Strings

Kang, Ho-Jung, Bae, Sung-Ho, Jeong, Min-Kyu, Joe, Sung-Min, Park, Byung-Gook, Lee, Jong-Ho

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 607 KB

english, 2015

21

A $\alpha $ -Si:H Thin-Film Phototransistor for a Near-Infrared Touch Sensor

Lee, Yeonsung, Omkaram, Inturu, Park, Jozeph, Kim, Hyun-Suk, Kyung, Ki-Uk, Park, Wook, Kim, Sunkook

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 493 KB

english, 2015

22

New Superjunction LDMOS Breaking Silicon Limit by Electric Field Modulation of Buffered Step Doping

Duan, Baoxing, Cao, Zhen, Yuan, Xaoning, Yuan, Song, Yang, Yintang

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 554 KB

english, 2015

23

Screen-Printed Si Paste for Localized B Doping in a Back Surface Field

Juan Hong,, Wei Wang,, Bao Shi,, Wei Zhang,

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 978 KB

english, 2015

24

Gate Bias Dependence of Complex Random Telegraph Noise Behavior in 65-nm NOR Flash Memory

Yang, Xiaonan, Zheng, Zhiwei, Wang, Yan, Huo, Zongliang, Jin, Lei, Jiang, Dandan, Wang, Zhongyong, Chiu, Shengfen, Wu, Hanming, Liu, Ming

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.40 MB

english, 2015

25

Influence of Passivation Oxide Thickness and Device Layout on the Current Gain of SiC BJTs

Lanni, Luigia, Malm, Bengt Gunnar, Ostling, Mikael, Zetterling, Carl-Mikael

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 818 KB

english, 2015

26

Solid-State Image Sensors

Journal:

IEEE Electron Device Letters

Year:

2015

File:

PDF, 291 KB

2015

28

42nd IEEE photovoltaic specialists conference 2015

Journal:

IEEE Electron Device Letters

Year:

2015

File:

PDF, 509 KB

2015

29