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Thermionic Emission as a Tool to Study Transport in Undoped nFinFETs
Tettamanzi, G.C., Paul, A., Lansbergen, G.P., Verduijn, J., Sunhee Lee,, Collaert, N., Biesemans, S., Klimeck, G., Rogge, S.Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2036134
Date:
February, 2010
File:
PDF, 365 KB
english, 2010